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Shimadzu SolidSpec-3700 UV-VIS-NIR Spectrophotometer, Metrology 6-8-12 inch Wafer
Stock IDWELL2876
Price
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Item Descriptions
Shimadzu SolidSpec-3700 UV/VIS/NIR Spectrophotometer is an optimized, high-performance wafer inspection equipment.
It has equipped with automatic X-Y testing system and an integrating sphere for precision measuring of 6" 8" 12"inch Silicon Wafers or for very large sample.
Key features
Large Sample Compartment
Software and control
System Control Computer & Data Acquisition SW: (Windows-7 O/S, SolidSpec-3700 Control SW), O... more
Specifications
- Three(3) Detectors: PMT, InGaAs, PbS
- Integrating sphere (Diffuse & Specular)
- Max.700mm × 560mm.
Included items
- (P/N 206-20810-58) Automatic X-Y Stage (Optional) installed for 6/8/12 inch Silicon Wafer (or a large solar-film glass). Sample Sizes: Max. 310mm dia. 310mm X 310mm, 40mm: A powerful tool for high-throughput measurements. This accessory automatically measures multiple points.
- (P/N 206-20264-91)Direct Detection Unit, DDU (Optional) installed. Measuring Range: 190nm ~3,300nm.
- (P/N 206-20570- 91) Large Specular Reflectance Attachment, 5° incident angle (Optional) included. Sample Sizes: Max. 470mm x 560mm, 40mm thickness.
- (P/N 204-58909) Film Holder(Optional) included. Sample Sizes: Min. 16mm W. × 32mm H / Max. 80mm W× 40mm H.
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