Shimadzu UV 3101PC UV-VIS-NIR, Absolute Specular Reflectance Attachments
Stock IDWELL2793
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Item Descriptions
Shimadzu UV-3101PC UV-VIS-NIR Equipped with a MPC-3100 Multi-Purpose Large Sample Compartment affords the non-destructive transmittance/reflectance measurement of various optical and electronic materials, including thin film, lens, large-sized glass, silicon wafers, optical parts, new materials, liquid crystal substrates and solar cells, beyond the measurement of solar cell components.
This system is designed for transmittance/reflectance measurement of solid samples.
Included items
You can build a system that is well-suited for a particular measurement purpose by combining the system with a variety of accessories, such as absolute specular reflection attachment in incedent Angles of 5°, 15°, 30°, 45°.
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