Shimadzu MPC-3100 Multi-Purpose Large Sample Compartment with its built-in integrating sphere enables the non- destructive transmission/reflectance measurements of very large samples or various-shaped samples - optical and electronic materials, including thin film, lens, large- sized glass, silicon wafers, optical parts, new materials, liquid crystal substrates and solar cells, etc.

• ASR-3105, INCEDENT ANGLE 5ﾟ CAT: 206-16817
• ASR-3112, INCEDENT ANGLE 12°CAT: 206-16100
• ASR-3130, INCEDENT ANGLE 30°CAT: 206-15001

• ASR-3145, INCEDENT ANGLE 45°CAT: 206-15002 MPC-3100 offers enormous flexibility for the evaluation and quality control of a wide variety of optical components over a measurement wavelength range of 240 to 2600 nm. For UV-3600 and UV-3101 UV-VIS-NIR Spectrophotometers - High performance measurements for the most demanding samples. Maximum Sample Size:
• You can build a system that is well-suited for a particular measurement purpose by combining this MPC-3100 system with a variety of sample accessories, such as Absolute Specular Reflection Attachment (ASR).

Transmission:305 mm dia.X 50mm T or 204 mm dia.X... more