Thermo Nicolet 6700 Spectrometer Solid Wafer Profiling FT-IR System
Stock IDWELL2914
Price
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Item Descriptions
Thermo-Nicolet 6700 FT-IR Solid Wafer Profiling System is equipped with a KBr beam splitter (7800 - 350 cm-1) and DTGS detector and comes as a set with four(4) different optional measuring accessories that allows a wide variety of solid material measurements.
This Ni 6700 solid wafer profiling system is a powerful tool optimized for the characterization research of transmittance and reflectance properties of solid and silicon wafer samples.
Key features
#4. Smart SplitPea Micro Sampling ATR.
Software and control
#1. Polarizer (Option) for SRA, VAWH Accessory Modules: it fits in SRA or FT-IR sample windows,
Included items
- #2. Wafer Specular Reflectance Analyzer (2 ~ 5 inch, V-N type SRA) with Accessory Inserts,
- #3. Variable Angle Wafer Analyzer("VAWH") for Transmission Measurements: Holder to accommodates round wafers: 8", 6", 4" and 2" in dia.; 125 micron to 2 mm thick. Angular Range: 0 - 60° incident angle relative to the normal,
Condition
Fully tested operational, great working condition.
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